A perspective on multiparameter quantum metrology: From theoretical tools to applications in quantum imaging (2020)

First Author: Albarelli F

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.physleta.2020.126311

Publication URI: http://dx.doi.org/10.1016/j.physleta.2020.126311

Type: Journal Article/Review

Parent Publication: Physics Letters A

Issue: 12