X-ray mapping in a scanning transmission electron microscope of InGaAs quantum dots with embedded fractional monolayers of aluminium (2020)
Attributed to:
Sir Henry Royce Institute -Sheffield Equipment
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1361-6641/ab8c52
Publication URI: http://dx.doi.org/10.1088/1361-6641/ab8c52
Type: Journal Article/Review
Parent Publication: Semiconductor Science and Technology
Issue: 8