X-ray mapping in a scanning transmission electron microscope of InGaAs quantum dots with embedded fractional monolayers of aluminium (2020)

First Author: Walther T
Attributed to:  Sir Henry Royce Institute -Sheffield Equipment funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1361-6641/ab8c52

Publication URI: http://dx.doi.org/10.1088/1361-6641/ab8c52

Type: Journal Article/Review

Parent Publication: Semiconductor Science and Technology

Issue: 8