Optimal and automated mask alignment for use in edge illumination X-ray differential-phase and dark-field imaging techniques (2020)

First Author: Doherty A
Attributed to:  Nikon-UCL Prosperity Partnership on Next-Generation X-Ray Imaging funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.nima.2020.164602

Publication URI: http://dx.doi.org/10.1016/j.nima.2020.164602

Type: Journal Article/Review

Parent Publication: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment