Bidirectional Volatile Signatures of Metal-Oxide Memristors-Part II: Modeling (2020)

First Author: Giotis C

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2020.3022343

Publication URI: http://dx.doi.org/10.1109/ted.2020.3022343

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 11