Detectors-The ongoing revolution in scanning transmission electron microscopy and why this important to material characterization (2020)

First Author: MacLaren I
Attributed to:  Fast Pixel Detectors: a paradigm shift in STEM imaging funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/5.0026992

Publication URI: http://dx.doi.org/10.1063/5.0026992

Type: Journal Article/Review

Parent Publication: APL Materials

Issue: 11