Electrically Erasable Optical I/O for Wafer Scale Testing of Silicon Photonic Integrated Circuits (2020)

First Author: Yu X

Attributed to: Silicon Photonics for Future Systems funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/jphot.2020.3027799

Publication URI: http://dx.doi.org/10.1109/jphot.2020.3027799

Type: Journal Article/Review

Parent Publication: IEEE Photonics Journal

Issue: 5