Simple technique for determining the refractive index of phase-change materials using near-infrared reflectometry (2020)
Attributed to:
GCRF - START: Synchrotron Techniques for African Research and Technology
funded by
GCRF
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1364/ome.395353
Publication URI: http://dx.doi.org/10.1364/ome.395353
Type: Journal Article/Review
Parent Publication: Optical Materials Express
Issue: 7