Impact of ultra-thin Al2O3- y layers on TiO2- x ReRAM switching characteristics (2017)

First Author: Trapatseli M

Attributed to: Reliably unreliable nanotechnologies funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.4983006

Publication URI: http://dx.doi.org/10.1063/1.4983006

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 18