DD76BB52-5A3F-4FEA-9F8D-34EC48714559Reliably unreliable nanotechnologiesFellowshipEP/K017829/1798CB33D-C79E-4578-83F2-72606407192CEPSRCINCOME_ACTUAL110895115BC14E2-B98E-4DDE-A282-434C74CC91CCAn ultra-low voltage RRAM read-out technique employing dithering principles8b0336bec9f37f058bb049ccdbb5665dXing J2016-01-01http://dx.doi.org/10.1109/iscas.2016.7538870http://dx.doi.org/10.1109/iscas.2016.7538870Conference/Paper/Proceeding/Abstract603064d0cc53a