Characterisation of small embedded two-dimensional defects using multi-view Total Focusing Method imaging algorithm (2021)

First Author: Budyn N

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.ndteint.2021.102413

Publication URI: http://dx.doi.org/10.1016/j.ndteint.2021.102413

Type: Journal Article/Review

Parent Publication: NDT & E International