UIS performance and ruggedness of stand-alone and cascode SiC JFETs (2020)

First Author: Agbo S

Attributed to: Underpinning Power Electronics 2012: Hub funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2020.113803

Publication URI: http://dx.doi.org/10.1016/j.microrel.2020.113803

Type: Journal Article/Review

Parent Publication: Microelectronics Reliability

ISSN: 0026-2714