Performance of SiC cascode JFETs under single and repetitive avalanche pulses (2020)
Attributed to:
Underpinning Power Electronics 2012: Hub
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2020.113644
Publication URI: http://dx.doi.org/10.1016/j.microrel.2020.113644
Type: Journal Article/Review
Parent Publication: Microelectronics Reliability
ISSN: 0026-2714