Microstructure Characterization in Individual Texture Components by X-Ray Line Profile Analysis: Principles of the X-TEX Method and Practical Application to Tensile-Deformed Textured Ti (2020)

First Author: Jóni B
Attributed to:  MIDAS - Mechanistic understanding of Irradiation Damage in fuel Assemblies funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.3390/cryst10080691

Publication URI: http://dx.doi.org/10.3390/cryst10080691

Type: Journal Article/Review

Parent Publication: Crystals

Issue: 8