Carrier dynamics at trench defects in InGaN/GaN quantum wells revealed by time-resolved cathodoluminescence. (2022)
Attributed to:
Time-resolved cathodoluminescence scanning electron microscope
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1039/d1nr06088k
PubMed Identifier: 34919106
Publication URI: http://europepmc.org/abstract/MED/34919106
Type: Journal Article/Review
Volume: 14
Parent Publication: Nanoscale
Issue: 2
ISSN: 2040-3364