Investigating GaN power device double-pulse testing efficacy in the face of V TH -shift, dynamic R dson , and temperature variations (2021)

First Author: Hedayati M
Attributed to:  Quietening ultra-low-loss SiC & GaN waveforms funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/apec42165.2021.9487358

Publication URI: http://dx.doi.org/10.1109/apec42165.2021.9487358

Type: Conference/Paper/Proceeding/Abstract