Investigating GaN power device double-pulse testing efficacy in the face of V TH -shift, dynamic R dson , and temperature variations (2021)
Attributed to:
Quietening ultra-low-loss SiC & GaN waveforms
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/apec42165.2021.9487358
Publication URI: http://dx.doi.org/10.1109/apec42165.2021.9487358
Type: Conference/Paper/Proceeding/Abstract