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Simulations and Measurements of Failure Modes in SiC Cascode JFETs under Short Circuit Conditions (2021)

First Author: Agbo S

Attributed to: Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/compel52922.2021.9646031

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85124225533

Type: Conference/Paper/Proceeding/Abstract