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Mode I fracture toughness determination in Cu/W nano-multilayers on polymer substrate by SEM - Digital Image Correlation (2020)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.jmps.2020.104145

Publication URI: http://dx.doi.org/10.1016/j.jmps.2020.104145

Type: Journal Article/Review

Parent Publication: Journal of the Mechanics and Physics of Solids

ISSN: 00225096