Evidence of Improved Thermal Stability via Nanoscale Contact Engineering in IGZO Source-Gated Thin-Film Transistors (2023)
Attributed to:
Design for high-yield manufacturing of printed circuits
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.17863/cam.96641
Publication URI: https://www.repository.cam.ac.uk/handle/1810/349837
Type: Journal Article/Review