Photoconductive Laser Spectroscopy as a Method to Enhance Defect Spectral Signatures in Amorphous Oxide Semiconductor Thin-film Transistors (2019)

First Author: Dhara S
Attributed to:  The Physics and Engineering of Oxide Semiconductors for Large-Area CMOS funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.35804

Publication URI: https://www.repository.cam.ac.uk/handle/1810/288518

Type: Journal Article/Review