Effect of irradiation and annealing performed with bias voltage applied across the coupling capacitors on the interstrip resistance of ATLAS ITk silicon strip sensors (2023)
Attributed to:
ATLAS Upgrade 2018 Phase-II Construction
funded by
STFC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.nima.2022.167726
Publication URI: http://dx.doi.org/10.1016/j.nima.2022.167726
Type: Journal Article/Review
Parent Publication: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment