Highly 28Si enriched silicon by localised focused ion beam implantation (2024)
Attributed to:
Cryogenic Ultrafast Scattering-type Terahertz-probe Optical-pump Microscopy (CUSTOM)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1038/s43246-024-00498-0
Publication URI: http://dx.doi.org/10.1038/s43246-024-00498-0
Type: Journal Article/Review
Parent Publication: Communications Materials
Issue: 1