Efficiently measuring a quantum device using machine learning (2018)
Attributed to:
Quantum Technology Capital: An extensible simulation and test platform for quantum and quantum enabled technologies
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.1810.10042
Publication URI: https://arxiv.org/abs/1810.10042
Type: Other