Improved sub-threshold slope in short-channel vertical MOSFETs using FILOX oxidation (2009)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.sse.2009.02.016

Publication URI: http://dx.doi.org/10.1016/j.sse.2009.02.016

Type: Journal Article/Review

Parent Publication: Solid-State Electronics

Issue: 7