High-accuracy analysis of nanoscale semiconductor layers using beam-exit ar-ion polishing and scanning probe microscopy. (2013)
Attributed to:
Coupling of single quantum dots to two-dimensional systems
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/am400270w
PubMed Identifier: 23528037
Publication URI: http://europepmc.org/abstract/MED/23528037
Type: Journal Article/Review
Volume: 5
Parent Publication: ACS applied materials & interfaces
Issue: 8
ISSN: 1944-8244