Soft X-ray characterisation of organic semiconductor films (2013)

First Author: McNeill C
Attributed to:  Interfacial domain structure of polycrystalline semiconducting polymer films funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1039/c2tc00001f

Publication URI: http://dx.doi.org/10.1039/c2tc00001f

Type: Journal Article/Review

Parent Publication: J. Mater. Chem. C

Issue: 2