Strain relaxation in InGaN/GaN micro-pillars evidenced by high resolution cathodoluminescence hyperspectral imaging (2012)

First Author: Xie E

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.4733335

Publication URI: http://dx.doi.org/10.1063/1.4733335

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 1