Analysis of electron capture at oxide traps by electric field injection (2013)
Attributed to:
High permittivity dielectrics on Ge for end of Roadmap application
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.4807845
Publication URI: http://dx.doi.org/10.1063/1.4807845
Type: Journal Article/Review
Parent Publication: Applied Physics Letters
Issue: 21