Using TEM and XRD to probe crystal orientation in organic thin films grown with OMBD (2012)
Attributed to:
Molecular Spintronics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1742-6596/371/1/012042
Publication URI: http://dx.doi.org/10.1088/1742-6596/371/1/012042
Type: Journal Article/Review
Parent Publication: Journal of Physics: Conference Series