A novel wafer-scale CMOS APS X-ray detector for breast cancer diagnosis using X-ray diffraction studies (2012)

First Author: Konstantinidis A

Attributed to: MI-3 Plus funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/7/12/c12005

Publication URI: http://dx.doi.org/10.1088/1748-0221/7/12/c12005

Type: Journal Article/Review

Parent Publication: Journal of Instrumentation

Issue: 12