Improved sensitivity at synchrotrons using edge illumination X-ray phase-contrast imaging (2013)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/8/06/c06002
Publication URI: http://dx.doi.org/10.1088/1748-0221/8/06/c06002
Type: Journal Article/Review
Parent Publication: Journal of Instrumentation
Issue: 06