Time-Domain Modeling of Low-Frequency Noise in Deep-Submicrometer MOSFET (2008)

First Author: Hamid N

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tcsi.2007.910543

Publication URI: http://dx.doi.org/10.1109/tcsi.2007.910543

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Circuits and Systems I: Regular Papers

Issue: 1