Frequency Domain Estimation of Integrated Volatility for Itô Processes in the Presence of Market-Microstructure Noise (2010)

First Author: Olhede S

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1137/090756363

Publication URI: http://dx.doi.org/10.1137/090756363

Type: Journal Article/Review

Parent Publication: Multiscale Modeling & Simulation

Issue: 2