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Structural inhomogeneity in silicon-on-insulator probed with coherent X-ray diffraction (2010)

First Author: Shi X

Attributed to: Coherent Surface X-ray Diffraction investigation of Thiol-induced structural changes in Gold funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1524/zkri.2010.1354

Publication URI: http://dx.doi.org/10.1524/zkri.2010.1354

Type: Journal Article/Review

Parent Publication: Zeitschrift für Kristallographie

Issue: 12