Statistical-Variability Compact-Modeling Strategies for BSIM4 and PSP (2010)
Attributed to:
Meeting the design challenges of the nano-CMOS electronics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/mdt.2010.53
Publication URI: http://dx.doi.org/10.1109/mdt.2010.53
Type: Journal Article/Review
Parent Publication: IEEE Design & Test of Computers
Issue: 2