Aberration-corrected scanning transmission electron microscopy for atomic-resolution studies of functional oxides (2014)

First Author: MacLaren I

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1179/1743280413y.0000000026

Publication URI: http://dx.doi.org/10.1179/1743280413y.0000000026

Type: Journal Article/Review

Parent Publication: International Materials Reviews

Issue: 3