Scattering Loss Estimation Using 2-D Fourier Analysis and Modeling of Sidewall Roughness on Optical Waveguides (2013)

First Author: Jaberansary E

Attributed to: UK Silicon Photonics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/jphot.2013.2251869

Publication URI: http://dx.doi.org/10.1109/jphot.2013.2251869

Type: Journal Article/Review

Parent Publication: IEEE Photonics Journal

Issue: 3