Nanosecond time-resolved Raman thermography: Probing device and channel temperature in pulsed GaN and GaAs HEMTs (2008)
Attributed to:
Novel Time-Resolved Thermal Imaging: AlGaN/GaN Heterostructure Field Effect Transistors
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Type: Conference/Paper/Proceeding/Abstract