A novel technique combining high resolution synchrotron X-ray Micro-Tomography and X-ray Diffraction for characterisation of micro particulates (2010)

First Author: V Ramachandran
Attributed to:  PLATFORM: A Research Platform for Next Generation Process Tomography : 2005-2009 funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Type: Conference/Paper/Proceeding/Abstract