Smart diagnostics for in situ light and particle beam imaging
Lead Research Organisation:
University of Manchester
Department Name: Electrical and Electronic Engineering
Abstract
The ability to characterise intense beams of photons, X-rays and particles fully transparent and in situ with supremely high precision opens up new directions in fundamental and applied sciences. Whether this is for the characterisation of nano-metre sized structures, to allow dynamic laser spot focusing at various depths of the material whilst cutting or to control the delivery and dose of a X-ray or particle beam during radiation therapy, the new technology excels in providing real-time measurements and outputs that can be used to apply fast corrections of beam shape, position and intensity. At the University of Manchester, a novel way to image intense beams fully transparent with high spatial resolution and a high update rate has been invented. The development has been driven by the needs of the current and future facility and end-user requirements in close collaboration with a couple of facility groups operating at the cutting edge of technology. The technology has been undergoing trials in close collaboration with selected users and has proven to be highly successful to the point that users want to buy and use this innovative technology. This interest, in turn, has led to a protection of the underlying method supported actively and financially by our technology transfer office (UMIP Ltd.) after an in depth evaluation of the commercial potential of the invention. Through meetings with potential license holders we have identified a preferred commercial partner that wants to introduce the technology commercially in 2010. They have helped us to define a strategy to go to market with our technology. This strategy calls for the development of two types of products that they want to introduce to the market. Their interest is understandable: if one considers the high quality of the produced technology demonstrators that is backed up by impressive evaluation results collected with collaborating users. But above all, the technology provides truly new diagnostics capabilities. For example, the ability to measure the cross-sectional intensity distribution (imaging) of the beam is unique and not available anywhere else. Also, the real-time image processing system that, through massive parallel processing, is able to extract essential data (integrated intensity, centre position and beam size) fast, removes the requirement of high-speed interfaces and off-line processing. A similar system is currently not available anywhere else on the market. Market research, from speaking directly to end users and potential licensees, shows that sales of the technology would be able to generate a significant volume of sales with both existing and new customers. It is our aim to create these two products within an 8-month period and to integrate a revised version of our real-time image processing module, to prepare a white paper which shows the performance and applications of our devices and to publish articles to inform potential customers. The funding would also give us resources to start developing further applications of the technology allowing us to create a product portfolio. Success of this proposal would support the research associate involved in the original work without loss of expertise, allowing the most efficient transfer of the technology from research and development to the commercial arena.
People |
ORCID iD |
Roelof Van Silfhout (Principal Investigator) |
Publications
Kachatkou A
(2013)
On the resolution and linearity of lensless in situ X-ray beam diagnostics using pixelated sensors
in Optics Express
Kachatkou A
(2014)
In situ micro-focused X-ray beam characterization with a lensless camera using a hybrid pixel detector.
in Journal of synchrotron radiation
Kachatkou A
(2013)
In situ X-ray beam imaging using an off-axis magnifying coded aperture camera system.
in Journal of synchrotron radiation
Van Silfhout R
(2011)
High-resolution transparent x-ray beam location and imaging.
in Optics letters
Van Silfhout R
(2014)
Position and flux stabilization of X-ray beams produced by double-crystal monochromators for EXAFS scans at the titanium K-edge.
in Journal of synchrotron radiation
Van Silfhout R
(2023)
A Power Efficient Heterogeneous Embedded Vision System
in Journal of Signal Processing Systems
Description | Creation of an instrument that is used at Diamond Light Source to measure X-ray beam parameters |
Exploitation Route | This technology is licensed to FMB Oxford Ltd by the University of Manchester |
Sectors | Electronics,Healthcare,Manufacturing, including Industrial Biotechology |
Description | Technology transfer to FMB Oxford Ltd and Diamond Light Source Ltd has taken place and is ongoing. |
First Year Of Impact | 2011 |
Sector | Energy,Pharmaceuticals and Medical Biotechnology,Other |
Impact Types | Economic |
Description | Diamond Light Source |
Organisation | Diamond Light Source |
Country | United Kingdom |
Sector | Private |
Start Year | 2008 |
Title | Beam Sensing |
Description | Method to measure, with high precision, position and shape of X-ray and particle beams without influencing the beam so the measurement can be performed in situ, during experiments. |
IP Reference | |
Protection | Patent granted |
Year Protection Granted | 2012 |
Licensed | Yes |
Impact | Further funding for development this technology in other areas. |
Title | FMB Oxford Licence |
Description | Licensed IPR developed with the EPSRC funding support to FMB Oxford Ltd. using UMIP Ltd. |
IP Reference | |
Protection | Protection not required |
Year Protection Granted | |
Licensed | Yes |
Impact | Further funding obtained to develop technology |