Radiation Damage Studies in CCDs and CMOS Imagers, X-ray CCDs for the XEUS Wide Field Imager and CMOS Sensor Development

Lead Research Organisation: The Open University
Department Name: Physical Sciences

Abstract

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Description This work is part of an onging scientific investigation into the effects of space radiation damage into such applications. The outputs provide benefit in a number of applications.
Exploitation Route Radiation damage in CMOS is of benefit to our CMOS imager developemnts for JUICE.
Radiation damage in X-ray will be of benefit to our new activity on the SMILE spacecraft.
Sectors Electronics,Manufacturing, including Industrial Biotechology

 
Description PTB/OU Research Collaboration 
Organisation Physikalisch-Technische Bundesanstalt
Department EUV Radiometry Working Group
Country Germany 
Sector Academic/University 
PI Contribution Scientific cooperation in the area of the development and characterization of detection systems for astrophysics applications
Collaborator Contribution Scientific cooperation in the area of the development and characterization of detection systems for astrophysics applications
Impact Papers
Start Year 2009
 
Description e2v/OU Collaboration 
Organisation High Performance Imaging Solutions; E2V Technologies
Country United Kingdom 
Sector Private 
PI Contribution Collaborative Research Contract Research PhD Training Employee Training Knowledge Exchange Workshops Patents
Collaborator Contribution Sponsorship In-kind contributions (staff) In-kind contributions (devices) Knowledge Exchange
Impact CASE Studentships IPS Funding Collaborative Partners European Space Agency Funding Collaborative Partners Patents