Development of advanced non-invasive instrumentation using Cherenkov diffraction radiation

Cherenkov diffraction radiation appears when a fast charged particle moves in the vicinity and parallel to a dielectric interface. In this case Cherenkov radiation generated from the interface propagates inside the dielectric and refracted from an out put dielectric surface. The properties of the radiation depend on position, direction and transverse dimensions of the charged particle, giving an opportunity to develop novel instruments for charged particle beam diagnostics.