In-situ TEM Observations of Atomic Scale Dynamics at Materials Interfaces

The aim of this project is to help further the understanding of atomic scale dynamics at materials interfaces. With the use of transmission electron microscopy, interfaces in their normal operating conditions can be directly imagined in-situ, allowing for accurate analysis of technology-leading materials. This analysis is important in the production of more efficient, cleaner, and effective materials in many areas of materials science.
Using the aberration corrected transmission electron microscope available at the University of Liverpool, a method of image acquisition will be developed using a variety of techniques, including compressive sensing and machine learning, to lower the beam energy required to observe materials without a loss of image quality. This lower beam energy will allow accurate imaging of important beam sensitive materials that are currently incapable of being imaged that will have great contributions to both research and industry, nationally and internationally.