Multi-target multi-sensor 6DOF self-traceable dynamic metrology system for large volumes based on frequency-scanning interferometry

Abstract

No abstract provided

Bibliographic Information

Publication URI: http://www.macroscale.org/macroscale/fileadmin/documents/macroscale/abstracts/2014/Preliminary_Programme_Talks.pdf

Type: Conference/Paper/Proceeding/Abstract

Parent Publication: MacroSCALE 2014 proceedings