Calibration of thickness-dependent k-factors of Germanium X-ray lines for improved analytical transmission electron microscopy of SiGe layers (2012)
Attributed to:
Renaissance Germanium
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Type: Conference/Paper/Proceeding/Abstract
Volume: 2
Parent Publication: Proc. EMC2012
ISBN: 9780950246369