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Microstructure and mechanical properties of physical vapor deposited Cu/W nanoscale multilayers: Influence of layer thickness and temperature (2014)

First Author: Monclús M

Attributed to: Micro Materials NanoTest Vantage Testing Suite with NTX4Controller funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.tsf.2014.05.044

Publication URI: http://dx.doi.org/10.1016/j.tsf.2014.05.044

Type: Journal Article/Review

Parent Publication: Thin Solid Films