Microstructural investigation on the grain refinement occurring in Cu-doped Ni-Ti thin films (2014)

First Author: Callisti M
Attributed to:  Micro Materials NanoTest Vantage Testing Suite with NTX4Controller funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.scriptamat.2014.01.021

Publication URI: http://dx.doi.org/10.1016/j.scriptamat.2014.01.021

Type: Journal Article/Review

Parent Publication: Scripta Materialia