Negative bias temperature instability lifetime prediction: Problems and solutions (2013)
Attributed to:
High permittivity dielectrics on Ge for end of Roadmap application
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/iedm.2013.6724638
Publication URI: http://dx.doi.org/10.1109/iedm.2013.6724638
Type: Conference/Paper/Proceeding/Abstract