A Single Pulse Charge Pumping Technique for Fast Measurements of Interface States (2011)

First Author: Lin L
Attributed to:  High permittivity dielectrics on Ge for end of Roadmap application funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2011.2122263

Publication URI: http://dx.doi.org/10.1109/ted.2011.2122263

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 5