A New Mobility Extraction Technique Based on Simultaneous Ultrafast $I_{d}$-$V_{g}$ and $C_{\rm cg}$-$V_{g}$ Measurements in MOSFETs (2012)

First Author: Ji Z
Attributed to:  High permittivity dielectrics on Ge for end of Roadmap application funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2012.2196519

Publication URI: http://dx.doi.org/10.1109/ted.2012.2196519

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 7