New Analysis Method for Time-Dependent Device-To-Device Variation Accounting for Within-Device Fluctuation (2013)

First Author: Duan M
Attributed to:  High permittivity dielectrics on Ge for end of Roadmap application funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2013.2270893

Publication URI: http://dx.doi.org/10.1109/ted.2013.2270893

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 8